JEOL JSM-5600LV type electron microscope
- The JEOL JSM-5600LV type electron microscope was put into operation in 1998.
- This microscope is used for observation of samples in a broad magnification
range up to 300 000. The special LV (low vacuum) mode
allows nonconductive specimens, (especially biological samples)
to be observed in their native state.
- The images can be stored on conventional photographic film or in digital form.
- The elemental analysis of the specimen is also possible using
the attached energy dispersive X-ray spectrometer (EDS) and an X-ray fluorescence (XRF) unit.
- The electron microscope is operated at the
Department of Radiation Chemistry